SENCORE LC103電容和電感分析儀

LC103 Condensed Specifications  

IN-CIRCUIT TESTS (Capacitors and Inductors):
- Dynamic in-circuit tests to determine whether the component is good or bad.
Component Types: Electrolytic, double layer lytic, tantalum, ceramic, and other capacitors.
Yokes, flybacks, switching transformers, and coils.
Inductor Range: 3.18 uH to 3.18 H
Capacitor Range: 0.002 uF to 20,000 uF
Accuracy: Same as Out-of-Circuit tests for known good inductors and capacitors with no parallel    current paths.
Suggest Removal Indication: Initiated when AC test differs from DC test by more than 20%, or if low level DCR test indicates a leakage path greater than 20% of charge current for capacitors.
CAPACITORS (Out-of-Circuit):
Value: Dynamic test of capacity value is determined by applying a constant current to the capacitor and measuring the dV/dt.
Range: 1 pF to 20 F
Accuracy: ±1%, ±1 pF, ±1 digit for values to 1990 uF, ±5%; 0.1% of range full scale for values 2000 uF to 20 F

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NI (美國(guó)國(guó)家儀器)、Tektronix泰克、HP/Agilent/Keysight（惠普/安捷倫/是德）、Keithley（吉時(shí)利）、KIKUSUI（菊水）、Panasonic（松下）、MINOLTA（美能達(dá)）、Anritsu（安立）、 ADVANTEST（愛德萬）、FLUK(福祿克)、MARCONI（馬克尼）、R/S（羅德&施瓦茨）、Chroma(致茂/可羅馬) 、Prodigit(博計(jì)) 、Extech(華儀)、JDSU(捷迪訊）、Ando（安騰）、Aeroflex（艾法斯）、ITECH(艾德克斯)、STANFORD（斯坦福）、Lambda（電盛蘭達(dá)）、YOKOGAWA（橫河）、EMCSOSIN（索莘）、RIGOL（普源）、IQ（萊特波特）、Lecroy（力科）、SUNLILAB（陽光）、Prima（普銳馬）、TOPCON（拓普）、SPIRENT(思博倫）、3ctest（泰斯特）、CYBERTEK(知用）、SHIBASOKU（芝測(cè)）、HAMEG（惠美）、TEXIO（德士）、EXFO（愛斯福）、GWINSTEK （固緯）