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FT-340系列雙電測電四探針方阻電阻率測試儀

FT-340 Series Double electric four-probe resistance ratio tester

一.廣泛用于Widely used：

覆蓋膜;導(dǎo)電高分子膜，高、低溫電熱膜;隔熱、防輻射導(dǎo)電窗膜導(dǎo)電(屏蔽)布、裝飾膜、裝飾紙;金屬化標(biāo)簽、合金類箔膜;熔煉、燒結(jié)、濺射、涂覆、涂布層，電阻式、電容式觸屏薄膜;電極涂料，其他半導(dǎo)體材料、薄膜材料方阻測試

硅晶塊、晶片電阻率及擴(kuò)散層、外延層、ITO導(dǎo)電箔膜、導(dǎo)電橡膠等材料方塊電阻半導(dǎo)體材料/晶圓、太陽能電池、電子元器件，導(dǎo)電薄膜（ITO導(dǎo)電膜玻璃等），金屬膜，導(dǎo)電漆膜，蒸發(fā)鋁膜，PCB銅箔膜，EMI涂層等物質(zhì)的薄層電阻與電阻率導(dǎo)電性油漆，導(dǎo)電性糊狀物，導(dǎo)電性塑料，導(dǎo)電性橡膠，導(dǎo)電性薄膜，金屬薄膜，抗靜電材料， EMI 防護(hù)材料，導(dǎo)電性纖維，導(dǎo)電性陶瓷等，提供中文或英文兩種語言操作界面選擇，滿足國內(nèi)及國外客戶需求.

covering film;Conductive polymer film. high and low temperature electric film;Insulation. anti-radiation conductive film (shielding) cloth. decorative film. decorative paper.metallized labels and alloy foil films.Smelting. sintering. sputtering. coating. Coating layer. resistance. capacitive touch screen.Electrode coating. other semiconductor materials. thin-film material resistance testing.

Silicon block. chip resistance rate and diffusion layer. epitaxial layer. ITO conductive foil. conductive rubber materials such as square resistance .semiconductor materials/wafer. solar cells. electronic components. conductive film (ITO conductive film glass. etc.). metal film.Conductive paint film, evaporation aluminum membrane. PCB copper foil membrane. EMI coating materials such as sheet resistance and resistivity of conductive paint. conductive paste and conductive plastic. conductive rubber. conductive film. metal film. anti-static materials. EMI shielding materials. conductive fiber. conductive ceramics. etc.. provide the interface to choose Chinese or English two languages. Meet the demand of domestic and foreign customers.

二．描述Description：

采用四探針組合雙電測量方法，液晶顯示，自動測量，自動量程，自動系數(shù)補(bǔ)償.高集成電路系統(tǒng)、恒流輸出；選配：PC軟件進(jìn)行數(shù)據(jù)管理和處理.

雙電測數(shù)字式四探針測試儀是運(yùn)用直線或方形四探針雙位測量。該儀器設(shè)計(jì)符合單晶硅物理測試方法國家標(biāo)準(zhǔn)并參考美國 A.S.T.M 標(biāo)準(zhǔn)。利用電流探針、電壓探針的變換，進(jìn)行兩次電測量，對數(shù)據(jù)進(jìn)行雙電測分析，自動消除樣品幾何尺寸、邊界效應(yīng)以及探針不等距和機(jī)械游移等因素對測量結(jié)果的影響，它與單電測直線或方形四探針相比，大大提高精確度，特別是適用于斜置式四探針對于微區(qū)的測試。

Adopt four probe combination double electric measurement method. Liquid crystal display. automatic measurement. automatic range. Automatic coefficient compensation. High integrated circuit system. constant current output;optional to buy: PC software for data management and processing.

規(guī)格型號/ model	FT-341	FT-342	FT-343	FT-345	FT-346	FT-347
1.方塊電阻sheet resistance	10-5～2×105Ω/□	10-4～2×105Ω/□	10-3～2×105Ω/□	10-3～2×104Ω /□	10-2～2×105Ω/□	10-2～2×104Ω/□
2.電阻率Resistivity	10-6～2×106Ω-cm	10-5～2×106Ω-cm	10-4～2×106Ω-cm	10-4～2×105Ω-cm	10-3～2×106Ω-cm	10-3～2×106Ω-cm
3.測試電流Test current	0.1μA.μA.0μA，100μA，1mA，10mA，100mA	1μA，10μA，100μA，1mA，10mA，100mA	0.1μA.μA，10μA，100μA，1mA，10mA，100 mA	1μA，10μA，100μA，1mA，10mA，100mA	0.1μA、1μA、10μA，100μA，1mA，10mA，100mA	1μA，10μA，100μA，1mA，10mA，100mA
4.電流精度Current	±0.1% accuracy	±0.2% accuracy	±0.2% accuracy	±0.3% accuracy	±0.3% accuracy	±0.3% accuracy
5.電阻精度Resistance	≤0.3% accuracy	≤0.3% accuracy	≤0.3% accuracy	≤0.5% accuracy	≤0.5% accuracy	≤0.5% accuracy
6.顯示讀數(shù)display	大屏液晶顯示：電阻、電阻率、方阻、溫度、單位換算、溫度系數(shù)、電流、電壓、探針形狀、探針間距、厚度、電導(dǎo)率Large screen LCD: Resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity
7.測試方式	test mode雙電測量Double electrical measurement
8.電源Power	輸入: AC 220V±10%.50Hz 功耗：<30W
9.誤差errors	整機(jī)不確定性Machine uncertain≤3%（標(biāo)準(zhǔn)樣片結(jié)果）/≤3%（standard samples）
10.選購功能choose to buy	選購1.pc軟件；選購2.方形探頭；選購3.直線形探頭；選購4.測試平臺；5.標(biāo)準(zhǔn)電阻.1.pc software; 2. square probe; 3. linear probe; 4. test platform
11.測試探頭test probe	探針間距選購：1mm；2mm；3mm三種規(guī)格; 探針材質(zhì)選購：碳化鎢針;白鋼針；鍍金磷銅半球形針Optional probe spacing: 1mm；2mm；3mm in three sizes.Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles.

Double electric digital four probe tester is used to measure two bits of a straight line or square four probe.The instrument is designed to meet the national standards of the single-crystal silicon physical test method and the American A.S.T.M standard.Using transformation of current probe and voltage probe to process two electric measurement. Double electrical analysis of data.automatically eliminate the sample geometry size and boundary effect and probe not equidistant and moving machinery. such as the factors influence on the measured results. Compared with the single electrical measuring linear or square four probe. greatly improve the accuracy. Especially suitable for diagonal four probe for micro area of the test.

三.技術(shù)參數(shù)Technical Parameters